Study and characterization of the irreversible transformation of electrically stressed planar Ti/TiO <sub>x</sub> /Ti junctions

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TitreStudy and characterization of the irreversible transformation of electrically stressed planar Ti/TiO x /Ti junctions
Type de publicationJournal Article
Year of Publication2015
AuteursGuillaume, N., E. Puyoo, M. Le Berre, D. Albertini, N. Baboux, C. Chevalier, K. Ayadi, J. Grégoire, B. Gautier, and F. Calmon
JournalJournal of Applied Physics
Volume118
Ticket14
Pagination144502
Date PublishedFeb-10-2016
ISSN0021-8979
DOI10.1063/1.4932646
Short TitleJournal of Applied Physics
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