Biblio

Guillaume, N., E. Puyoo, M. Le Berre, D. Albertini, N. Baboux, C. Chevalier, K. Ayadi, J. Grégoire, B. Gautier, and F. Calmon, "Study and characterization of the irreversible transformation of electrically stressed planar Ti/TiO _x /Ti junctions", Journal of Applied Physics, vol. 118, issue 14, pp. 144502, Feb-10-2016, 2015.