Imaging by atomic force microscopy of the properties difference of the layers covering the facets created during SIMS analysis

Par administrateur le dim, 12/29/2019 - 10:55
TitreImaging by atomic force microscopy of the properties difference of the layers covering the facets created during SIMS analysis
Type de publicationJournal Article
Year of Publication2014
AuteursFares, B., B. Gautier, D. Albertini, A. Mzerd, and M. Loghmarti
JournalApplied Surface Science
Volume308
Pagination24 - 30
Date PublishedJan-07-2014
ISSN01694332
DOI10.1016/j.apsusc.2014.04.054
Short TitleApplied Surface Science
Indéfini