Consortium Lyon Saint-Etienne de Microscopie (FED 4092)
Fast electron tomography: Applications to beam sensitive samples and in situ TEM or operando environmental TEM studies
By administrateur on Fri, 12/27/2019 - 11:55
| Title | Fast electron tomography: Applications to beam sensitive samples and in situ TEM or operando environmental TEM studies |
| Publication Type | Journal Article |
| Year of Publication | 2019 |
| Authors | Koneti, S., L. Roiban, F. Dalmas, C. Langlois, A-S. Gay, A. Cabiac, T. Grenier, H. Banjak, V. Maxim, and T. Epicier |
| Journal | Materials Characterization |
| Volume | 151 |
| Pagination | 480 - 495 |
| Date Published | Jan-05-2019 |
| ISSN | 10445803 |
| DOI | 10.1016/j.matchar.2019.02.009 |
| Short Title | Materials Characterization |
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